Evaluation of Tip Performance by XE-100 Atomic Force Microscopy (AFM)
نویسندگان
چکیده
منابع مشابه
AFM tip characterization by Kelvin probe force microscopy
Reliable determination of the surface potential with spatial resolution is key for understanding complex interfaces that range from nanostructured surfaces to molecular systems to biological membranes. In this context, Kelvin probe force microscopy (KPFM) has become the atomic force microscope (AFM) method of choice for mapping the local electrostatic surface potential as it changes laterally d...
متن کاملSurface Evaluation of Resin Zein Films Containing Sugar Plasticizers by Permeability and Atomic Force Microscopy Analysis
Zein is one of the best biopolymer for edible film making and sugars are natural plasticizers for biopolymers. In this research, sugars (fructose, galactose and glucose) at three levels (0.5, 0.7, 1 g/g of zein) were used as plasticizers for zein protein films and their water vapor permeability (WVP), oxygen permeability (OP) and atomic force microscopy (AFM) topography were studied. The p...
متن کاملHigh Resolution Image with Multi-wall Carbon Nanotube Atomic Force Microscopy Tip (RESEARCH NOTE)
In this paper, a simple and reproducible approach for attaching the multi-wall carbon nanotubes (MWNTs) to the apex of the atomic force microscope probe has been proposed. For this purpose, the dielectrophoresis method was applied due to its simple performance, cheapness and reliability. In this method, various parameters such as voltage, frequency, concentration of carbon nanotubes solution an...
متن کاملApplication of Atomic Force Microscopy (AFM) in Polymer Materials
Atomic force microscopy (AFM) is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution. AFM is extremely useful for studying the local surface molecular composition and mechanical properties of a broad range of polymer materials, including block copolymers, bulk polymers, thin-film polymers, polymer composites, and polymer...
متن کاملIn-Process Atomic-Force Microscopy (AFM) Based Inspection
A new in-process atomic-force microscopy (AFM) based inspection is presented for nanolithography to compensate for any deviation such as instantaneous degradation of the lithography probe tip. Traditional method used the AFM probes for lithography work and retract to inspect the obtained feature but this practice degrades the probe tip shape and hence, affects the measurement quality. This pape...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2003
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927603446205